Material Analysis using XAN 250

Application

  Material Analysis

    Precious Metal Analysis

    Gold analysis in manufacturing, refinery and Hallmarking centres.

   Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries

     race analysis for consumer protection, e.g. lead content in toys

     Analysis of alloys with highest requirements of accuracy in the jewellery and watch industries and in metal refineries

     Research in universities and in the industries

Design

The XAN 250 is designed as user-friendly bench-top instrument.
 XAN 250: Fixed sample support

For quick and easy sample positioning, the X-ray source and semiconductor detector assembly is located in the instruments lower chamber.
The measuring direction is from underneath the sample, which is supported by a transparent window.
The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment

Specification

Intended use Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, Gold  Testing, Gold analysis, trace elements and alloys
Element range Aluminium (13) to Uranium (92) up to 24 elements simultaneously
Design Bench top unit with upwards opening hood
Measuring direction Bottom up

X- Ray Source

X-ray tube Micro-focus tungsten tube with beryllium window
Aperture (Collimator) x changeable: 0.2 mm (7.9 mils), 0.6 mm (23.6 mils), 1 mm (39.4 mils), 2 mm (78.7 mils), others on request
Primary filter 6x changeable: Ni, free, Al 1000 m (39.4 mils); Al 500 m (19.7 mils); Al 100 m (3.9 mils); Mylar 100 m (3.9mils)
Measurement spot Depending on the measuring distance and on the aperture, the actual measurement spot size is shown in the video image. Smallest measurement spot: approx. 0.3 mm (11.8 mils)

X-Ray Detection

X-ray detector Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K) 160 eV
Measuring distance 0 25 mm (0 1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Sample Stage

Design Fixed sample support
Usable sample placement area 310 x 320 mm (12.2 x 12.6 in)
Max. sample weight 13 kg (29 lb)
Max. sample height 90 mm (3.5 in)

Dimensions

External dimensions Width x depth xheight 403 x 588 x 365 mm(16 x 23.2 x 14.4 in)
Weight Approx. 45 kg (99 lb)