Material Analysis Instrument

Applications

Material Analysis
Analysis of very thin coatings, e.g., gold/palladium coatings of 0.1 m Trace analysis on pc boards according to RoHS and WEEE requirements
Gold analysis
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g., in quality control

Features

The FISCHERSCOPE X-RAY XDV-SDD is an universally applicable energy-dispersive Xray fluorescence measuring instrument. It is especially well suited for measuring and analyzing very thin coatings or small concentrations in the trace analysis. With its high-precision, programmable XY-stage, it is the fitting measuring instrument for automated sample measurements

Design

The XDV-SDD is designed as a user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Z-axis. The sample stage moves into the loading position automatically, when the protective hood is opened. A laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.

Specification

Intended use Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, Gold testing , trace elements and alloys
Element rangeAluminium Al (13) to Uranium U (92) up to 24 elements simultaneously
Design Bench top unit with hood opening upwards, X/Y- and Z-axis electrically driven and programmable, Motor-driven changeable apertures and filters, Video camera and laser pointer (class 1) for positioning the sample
Measurement direction From top to bottom

X-Ray Source

X-ray tube Micro focus tube with tungsten target and beryllium window
Aperture (Collimator) 4x changeable 0.2 mm (7.9 mils), 0,6 mm (23.6 mils), 1 mm (39.4 mils), 3 mm (118 mils), others on request
Primary filter 6x changeable (Ni, free, Al 1000 m (39.4 mils), Al 500 m (19.7 mils), Al 100 m (3.9 mils), Mylar 100 m (3.9 mils)
Measurement spot size Depending on measurement distance and aperture Measurement spot size aperture size + 10% The actual measurement spot size is shown in the video image. Smallest measurement spot: approx. 0.25 mm (9.8 mils)

X-Ray Detection

X-ray detector Silicon Drift Detector (SDD), peltier-cooled
Resolution (fwhm for Mn-K) 140 eV
Measuring distance 0 80 mm (0 3.1 in) Distance compensation with patented DCM method for simplified measurements at varying distances

Sample Stage

Design Fast, programmable XY-stage with pop-out function
Usable sample placement area 370 x 320 mm (14.6 x 12.6 in)
Max. sample weight 5 kg (11 lb), with reduced approach travel precision 20 kg (44 lb)
Max. sample height 140 mm (5.5 in)
Max. Travel X/Y-axis: 250 mm x 250 mm (9.8 x 9.8 in); Z-axis: 140 mm (5.5 in)
Max. travel speed X/Y 60 mm/s (0.2 ft/s)
Repeatability precision X/Y unidirectional 5 m (0.2 mils) max., 2 m (0.08 mils) typ.

Dimensions

External dimensions Width x depth x height [mm] 660 x 835 x 720 mm, [in]: 26 x 32.9 x 28.3
Weight approx. 140 kg (308 lb)
Inner dimensions meas.chamber Width x depth x height [mm] 580 x 560 x 145 mm, [in]: 22.8 x 22 x 5.7