Application

Measurements on small parts like screws, bolts and nuts
Measurements on contacts and electronic components
Determining of the composition of electroplating baths
Measurements on very small parts, plug contacts and wires
Manual measurements on printed circuit boards
Measurements in the jewellery and watch industries

Features

The FISCHERSCOPE X-RAY XUL is high performance, compact and universally applicable x-ray measuring instruments. Fischerscope XUL is well suited for the non-destructive coating thickness measurement and material analysis. The instrument is well suited for measurements in quality assurance, incoming inspection and process control.

Design

The FISCHERSCOPE X-RAY XUL/XULM instruments are designed as user-friendly bench-top instruments. According to the intended use, different versions are available with different support stages
XUL 210: Fixed sample support
XUL 220 and XULM 240: Manually operable XY stage for accurate positioning of small parts
For quick and easy sample positioning, the X-ray source and detector assembly is located in the instrument‘s lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window. Despite of their compact size, the instruments are equipped with a large measurement chamber. This allows for measurements on larger specimens.

Specification

Intended use Energy dispersive x-ray fluorescence measuring instrument (EDXRF) for material analysis and coating thickness measurement
Element range hlorine (17) to Uranium (92) – up to 24 elements simultaneously with option WinFTM® BASIC Design Bench top unit with upwards opening hooz
Measuring direction Bottom up

X-Ray Source

X-ray tube Tungsten tube, thermally stabilized
Aperture (Collimator) Ø 0.3 mm (11.8 mils), optional slot Ø 0.3 x 0.05 mm (11.8 x 2 mils
Primary filter Fixed
Measurement spot size Depending on the measuring distance and on the aperture, the actual measurement spot size is shown in the video image. Smallest measurement spot: XUL 210 and XUL 220: approx. Ø 0,51 mm (20 mils

X-Ray Detection

X-ray detector Proportional counter tube
Measuring distance 0 … 25 mm (0 … 1 in), Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary

Dimensions

External dimensions Width x depth x height [mm] 403 x 588 x 444 mm (15.9 x 23.2 x 17.5 in
Weight Approx. 45 kg (100 lb)

Applications

Bath Analysis
Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm
Trace analysis on pc boards according to RoHS and WEEE requirements
Gold analysis
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g., in quality control

Features

The FISCHERSCOPE X-RAY XDV-SDD is an universally applicable energy-dispersive Xray fluorescence measuring instrument. It is especially well suited for measuring and analyzing very thin coatings or small concentrations in the trace analysis. With its high-precision, programmable XY-stage, it is the fitting measuring instrument for automated sample measurements.

Design

The XDV-SDD is designed as a user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Z-axis. The sample stage moves into the loading position automatically, when the protective hood is opened. A laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.

Specification

Intended use Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, Gold testing , trace elements and alloys
Element range Aluminium Al (13) to Uranium U (92) – up to 24 elements simultaneously
Design Bench top unit with hood opening upwards, X/Y- and Z-axis electrically driven and programmable, Motor-driven changeable apertures and filters, Video camera and laser pointer (class 1) for positioning the sample
Measurement direction From top to bottom

X-Ray Source

X-ray tube Micro focus tube with tungsten target and beryllium window
Aperture (Collimator) 4x changeable Ø 0.2 mm (7.9 mils), Ø 0,6 mm (23.6 mils), Ø 1 mm (39.4 mils), Ø 3 mm (118 mils), others on request
Primary filter 6x changeable (Ni, free, Al 1000 μm (39.4 mils), Al 500 μm (19.7 mils), Al 100 μm (3.9 mils), Mylar® 100 μm (3.9 mils)
Measurement spot size Depending on measurement distance and aperture Measurement spot size ≈ aperture size + 10% The actual measurement spot size is shown in the video image. Smallest measurement spot: approx. Ø 0.25 mm (9.8 mils)

X-Ray Detection

X-ray detector Silicon Drift Detector (SDD), peltier-cooled
Resolution (fwhm for Mn-Kα) ≤ 140 eV
Measuring distance 0 … 80 mm (0 … 3.1 in) Distance compensation with patented DCM method for simplified measurements at varying distances

Sample Stage

Design Fast, programmable XY-stage with pop-out function
Usable sample placement area 370 x 320 mm (14.6 x 12.6 in)
Max. sample weight 5 kg (11 lb), with reduced approach travel precision 20 kg (44 lb)
Max. sample height 140 mm (5.5 in)
Max. Travel X/Y-axis: 250 mm x 250 mm (9.8 x 9.8 in); Z-axis: 140 mm (5.5 in)
Max. travel speed X/Y 60 mm/s (0.2 ft/s)
Repeatability precision X/Y unidirectional ≤ 5 μm (0.2 mils) max., ≤ 2 μm (0.08 mils) typ.

Dimensions

External dimensions Width x depth x height [mm]660 x 835 x 720 mm, [in]: 26 x 32.9 x 28.3
Weight approx. 140 kg (308 lb)
Inner dimensions meas.chamber Width x depth x height [mm] 580 x 560 x 145 mm, [in]: 22.8 x 22 x 5.7