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Fischer measurement Technologies (India) Pvt. Ltd.

XRF Spectrometer : ROHS Screening XDV-SDD

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.

Design

  • These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis.
  • These have programmable XY-stage, which make these perfect for auto-mated sample measurements.
  • These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy.
  • These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage.
  • These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement.
  • These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement.
  • These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. 

Typical areas of application are:

  • Analysis of very thin coatings, e.g. gold/palladium coatings of ≤ 0.1 μm
  • Trace analysis on pc boards according to ROHS and WEEE requirements
  • Gold analysis
  • Measurement of functional coatings in the electronics and semiconductor industries
  • Determination of complex multi-coating systems
  • Automated measurements, e.g., in quality control

General Specification

  • Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys
  • Element range: Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously
  • Design: Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample
  • Measuring direction: From top to bottom

X-Ray Source

  • X-ray tube Micro focus tungsten tube with beryllium window
  • High voltage Three steps 10 kV, 30 kV, 50 kV
  • Aperture (Collimator): 4x changeable: Ø 0.2 mm (7.9 mils), Ø 0,6 mm (23.6 mils), Ø 1 mm (39.4 mils),Ø 3 mm (118 mils), others on request
  • Primary filter: 6x changeable (Ni, free, Al 1000 μm (39.4 mils), Al 500 μm (19.7 mils), Al 100 μm (3.9 mils), Mylar® 100 μm (3.9 mils)
  • Measurement spot size: Depending on measurement distance and aperture,Measurement spot size ≈ aperture size + 10% The actual measurement spot size is shown in the video  image.Smallest measurement spot: approx. Ø 0.25 mm (9.8 mils)

X-Ray Detection

  • X-ray detectorSilicon Drift Detector (SDD), peltier-cooled
  • Resolution (fwhm for Mn-Kα)≤ 140 eV
  • Measurement distance:0 … 80 mm (0 … 3.1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Sample Alignment

  • Video microscope High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement.
  • Zoom factor Digital 1x, 2x, 3x, 4x
  • Focusing Auto-focus and manually controlled motor focus.
    Manual adjustment of the focal plane in a range from 0 to 80 mm.
Sample Stage
  • Design Fast, programmable XY-stage with pop-out function
  • Maximum travel X/Y-axis: 250 mm x 250 mm (9.8 x 9.8 in); Z-axis: 140 mm (5.5 in)
  • Max. travel speed 60 mm/s (0.2 ft/s)
  • Repeatability precision XY unidirectional: ≤ 5 μm (0.2 mils) max., ≤ 2 μm (0.08 mils) typ.
  • Usable sample placement area 370 x 320 mm (14.6 x 12.6 in)
  • Max. sample weight5 kg (11 lb), with reduced approach travel precision 20 kg (44 lb)
  • Max. sample height 140 mm (5.5 in)

Electrical Data

  • Power supplyAC 115 V or AC 230 V 50 / 60 Hz
  • Power consumptionMax. 120 W ,without evaluation PC
  • Protection class IP40

Dimensions

  • External dimensions
    Width x depth x height [mm]:
    660 x 835 x 720 mm, [in]: 26 x 32.9 x 28.3
  • Interior dimensions Width x depth x height [mm]: measurement chamber  580 x 560 x 145 mm, [in]: 22.8 x 22 x 5.7
  • Weight Approx. 140 kg (308 lb)

Environmental Conditions

  • Temperature: Operation10 °C – 40 °C / 50 °F – 104 °F
  • Temperature:0 °C – 50 °C / 32 °F – 122 °F
  • Storage/Transport
  • Admissible air humidity≤ 95 %, non-condensing

Evaluation Unit

  • Computer Windows®-PC
  • Software Standard: Fischer WinFTM® BASIC including PDM®, Optional: Fischer WinFTM® SUPER

Standards

  • CE approval EN 61010
  • X-Ray standards DIN ISO 3497 and ASTM B 568
  • Approval Fully protected instrument with type approval according to the German regulations "Deutsche Rontgenverordnung-RoV".

Product details

Power consumption

Max. 120 W,without evaluation PC

Protection class

IP40

Weight

Approx. 140 kg (308 lb)

Temperature

0 to 50 Deg C / 32 to 122 Deg F

Computer

Windows-PC