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Solar Thin Film Coating Measurement XAN 5000
Our range of Solar Thin Film Coating Measurement is highly innovative and energy dispersive x-ray fluorescence measuring system (EDXRF) for in-line application of the industrial production sites. They are designed for constant non-destructive study and measurement of thin layers as well as layer systems in production lines. The rugged design meets the tough demands of varied industrial environments and for constant operation.
Applications
In the photovoltaic industry like CIGS, CIS, CdTe
Measurements on foils, glass panels and belts
Measurements on hot surfaces (water cooled version)
General Specification
Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to study and measure coatings as well as layer systems continuously in production processes.
Element range:Sodium Na (11) to Uranium U (92) if measured in vacuum Chlorine Cl (17) to Uranium U (92) if measured in the atmosphere.
Features
Calibration: Quick and simple with a master standard straight in the production process
Remote control: Via programmed tasks or via various data interfaces
Data Interface: RS232, TCP/IP, PROFIBUS, Command files, OLE automation and PROFINET OPC mainly with SPS type SIMATIC, others on request
X-Ray Source
X-ray tube: Microfocus tungsten tube with berylium window, other tubes on request
High voltage: Three steps: 10 kV, 40 kV, 50 kV
Aperture (Collimator): Fixed, adapted to the particular application
X-Ray Detection
X-ray detector:Peltier-cooled silicon-drift-detector (SDD)
Resolution (fwhm for Mn-K±): 140 eV
Signal processor: Digital pulse processor
Distance compensation: ± 3 mm (118 mils) for measurements on glass substrates, with specific applications on glass substrates up to ± 5 mm (197 mils)
Measuring distance: 60 - 100 mm (2.4 - 3.9 in), other distances on request
Electrical data
Power supply: AC 115 V or AC 230 V 50 / 60 Hz
Power consumption: max. 100 W (without evaluation PC)
Protection class:IP50
Evaluation unit
Computer:Windows®-PC
Software Standard: Fischer WinFTM® BASIC including PDM®
Optional: Fischer WinFTM® SUPER
Electrical Data
Power supply:AC 115 V or AC 230 V 50 / 60 Hz
Power consumption:Max. 120 W ,without evaluation PC
Protection class:IP40
Dimensions
|
| 5100 | 5400 |
| Weight | 37 kg (82 lb) | 47 kg (104 lb) |
| Flange dimensions | ISO 250F | ISO 250F |
| Outside W x D x H | 236 x 350 x 370 mm (9.3 x 13.8 x 14.6 in) | 236 x 350 x 370 mm (9.3 x 13.8 x 14.6 in) |
Environmental Conditions
|
| 5100 | 5400 |
| Measuring environment | Atmosphere | Vacuum |
| Maximum sample surface | 40oC (104oF) | 400oC (752oF) |
| Admissible air humidity | 95%, non- condensing | 95%, non- condensing |
| Storage temperature | 0oC - 50oC (32oF-122oF) | 0oC - 50oC (32oF - 122oF) |
| Operating temperature | 0oC-40oC (32oF-104oF) around the housing | 0oC - 40oC (32oF - 104oF) around the housing |
Standards
CE approval:EN 61010
X-Ray standards:DIN ISO 3497 and ASTM B 568
Approval:Individual approval. The provisions of local law have to be observed.