Coating Thickness
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Fischer measurement Technologies (India) Pvt. Ltd.

Lead Frame Coating Thickness Measurement XDV-U

Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.


  • Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames
  • Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils)
  • Measurement of functional coatings in the semiconductor and electronics industries
  • Determination of complex multi-coating systems
  • Automated measurements like quality control

General Specification

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures.

Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously.

Design:Bench-top unit with hood opening upwards and housing with a slot on the side.

X/Y- and Z-axis electrically driven and programmable

Motor-driven changeable filters

Measuring direction:Top down

X-Ray Source/Detection

X-ray tube:Standard: Micro focus tube with tungsten target and beryllium window

Optional: Micro focus tube with molybdenum target and beryllium window

High voltage:Three steps: 10 kV, 30 kV, 50 kV

Primary filter:4x changeable: Ni 10 m (0.4 mils); free; Al 1000 m (40 mils); Al 500 m (20 mils)

X-ray optics:Polycapillary

X-Ray Source/Detection

  • Standard Non halo-free
  • Option 20m Halo-free
  • Option 10m Non halo-free
  • Measurement spot, fwhm at Mo-K±
  • Appr.  20m (0.8 mils)
  • Appr.  20m (0.8 mils)
  • Appr.  10m (0.4 mils)

X-ray detector

  • Peltier-cooled silicon-drift-detector (SDD)
  • Peltier-cooled silicon-drift-detector (SDD)
  • Peltier-cooled silicon-drift-detector (SDD)

Effective detector area

  • 20 mm2 (0.03 in2)
  • 50 mm2 (0.08 in2)
  • 50 mm2 (0.08 in2)

For halo-free capillaries, the radiation intensity for energies of the x-radiation is concentrated on the small measurement spot. For capillaries, indicated as radiation, non halofree intensity with high energies (E > 20 keV) can cover a notably larger area than the nominal measurement spot.

Sample Alignment

Video Microscope: High-resolution CCD color camera for optical monitoring of the dimension location along the Crosshairs with a calibrated scale (ruler), primary beam axis, manual focusing and auto-focus, and spot-indicator, Adjustable LED illumination, Laser pointer (class 1) to support precise specimen placement.

Zoom factor:Up to 1080x (Optical: 30x, 90x, 270x; Digital: 1x, 2x, 3x, 4x)

X-Ray Detection

X-ray detector:Proportional counter tube

Absorber:XULM 240 only: optional cobalt or nickel absorber

Measuring distance:0 - 25 mm (0 - 1 in)

Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Evaluation Unit

  • Computer:Windows®-PC
  • Software:Standard: Fischer WinFTM® LIGHT
  • Optional: Fischer WinFTM® BASIC, PDM®, SUPER
  • Sample support stage
  • Sample Stage


Option Supporting Plate PCB


Speedy, programmable XY-stage with pop-out function

Quick, programmable XY-stage with pop-out function and large placement area for measurements on PCBs

Usable sample placement area

Width x depth: 370 mm x 320 mm (14.6 in x 12.6 in)

Width x depth: 620 mm x 530 mm (24.4 in x 20.9 in)

Usable maximum travel

X/Y-axis: 250 mm x 220 mm (9.8 in x 8.7 in) Z-axis: 140 mm (5.5 in)

X/Y-axis: 250 mm x 220 mm (9.8 in x 8.7 in) Z-axis: 140 mm (5.5 in)

Max. travel speed X/Y

60 mm/s (0.2 ft/s)

60 mm/s (0.2 ft/s)

Repeatability precision X/Y

unidirectional:  5 m (0.2 mils) max.,  2 m (0.08 mils) typ.

unidirectional:  5 m (0.2 mils) max.,  2 m (0.08 mils) typ.

Max. sample weight

5 kg (11 lb), with reduced precision max. 20 kg (44 lb)

5 kg (11 lb), with reduced precision max. 20 kg (44 lb)

Max. sample height

135 mm (5.3 in)

135 mm (5.3 in)

Electrical Data

  • Power supply:AC 115 V or AC 230 V 50 / 60 Hz
  • Power consumption:max. 120 W, without evaluation PC
  • Protection class:IP40


External dimensions:Width x depth x height [mm]: 660 x 835 x 720 mm (26 x 33 x 28.3 in)

Weight:Approx. 135 kg (297 lb)

Interior dimensions of chamber: Width x depth x height: 580 x 560 x 145 mm (22.8 x 22 x 5.7 in)

Environmental Conditions

Operating temperature:10oC - 40oC / 50oF - 104oF

Storage/Transport temperature:0oC - 50oC / 32oF - 122oF

Admissible air humidity: 95 %, non-condensing


  • CE approval: EN 61010
  • X-Ray standards:DIN ISO 3497 and ASTM B 568

Approval:Fully protected instrument with type approval according to the German regulations

Product details 


403 x 588 x 444 mm

Testing Methodology

Radiographic Testing



Service Type

Thickness Measurement

Value Data Report on



Mechanical Engineering