Coating Thickness
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Fischer measurement Technologies (India) Pvt. Ltd.

Fischerscope X-ray Xdv-sdd XDV SDD

Fischerscope X-ray Xdv-sdd

Design

  • These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically.
  • These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened.
  • These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured.
  • These are operated through the powerful and user-friendly WinFTM® software and designed as per German regulations Deutsche Röntgenverordnung-rov". Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software.
Typical areas of application are:
  • Analysis of very thin coatings of ≤ 0.1 μm (0.004 mils)
  • Measurements of functional coatings in the electronics and semiconductor industries
  • Determination of complex multi-coating systems
  • Automated measurements, e.g., in quality control
  • Determination of the lead content in solder

General Specification

  • Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys
  • Element range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously
  • Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample
  • Measuring direction:Top down

X-Ray Source

  • X-ray tubeMicro focus tungsten tube with beryllium window
  • High voltageThree steps 10 kV, 30 kV, 50 kV
  • Aperture (Collimator):4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm (23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request
  • Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)
  • Measurement spot:Depending on the measuring distance and on the aperture, the actual spot size is shown in the video image. Smallest measurement approx. Ø 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)

X-Ray Detection

  • X-ray detectorSilicon PIN detector with peltier cooling
  • Resolution (fwhm for Mn-Kα)≤ 200 eV
  • Measurement distance:0 … 80 mm (0 … 3.2 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Sample Alignment

  • Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement.
  • Zoom factorDigital 1x, 2x, 3x, 4x

Sample Stage

  • Design Programmable, motor-driven XY-stage
  • Maximum travel X/Y-axis: 255 x 235 mm (10 x 9 in); Z-axis: 140 mm (5 in)
  • Max. travel speed 80 mm/s (3.2 in/s)
  • Repeatability precision XY ≤ 0.01 mm (0.4 mils), unidirectional
  • Usable sample placement area Width x depth [mm]: 300 x 350 mm, [in]: 12 x 14
  • Max. sample weight 5 kg, with reduced approach travel precision 20 kg
  • Max. sample height 140 mm (5.5 in)

Electrical Data

  • Power supplyAC 115 V or AC 230 V 50 / 60 Hz
  • Power consumptionMax. 120 W ,without evaluation PC
  • Protection classIP40

Dimensions

  • External dimensions Width x depth x height [mm]:570 x 760 x 650 mm, [in]: 22 x 30 x 26
  • Interior dimensions Width x depth x height [mm]: measurement chamber460 x 495 x 146 mm, [in]: 18 x 19.5 x 5.7
  • Weight Approx. 115 kg (52 lb)

Environmental Conditions

  • Temperature: Operation10 °C – 40 °C / 50 °F – 104 °F
  • Temperature Storage/Transport:0 °C – 50 °C / 32 °F – 122 °F
  • Admissible air humidity≤ 95 %, non-condensing

Evaluation Unit

  • ComputerWindows®-PC
  • Software Standard: Fischer WinFTM® BASIC including PDM®, Optional: Fischer WinFTM® SUPER

Standards

  • CE approval EN 61010
  • X-Ray standards DIN ISO 3497 and ASTM B 568
  • Approval Fully protected instrument with type approval according to the German regulations "Deutsche Röntgenverordnung-RöV".