Coating Thickness
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Fischer measurement Technologies (India) Pvt. Ltd.

Fashion Jewellery Testing Machine XAN 220

Jewellery Gold testing machine XAN220 is available in a range of technical specifications for speedy and non-destructive study and coating thickness measurement of silver and gold alloys. The array of Fashion Jewellery Testing Machine is optimized X-ray fluorescence measuring instrument with compact size and reliable performance. They are used for the study of precious metals as well as their alloys in composition and coating thickness. They are used for measuring up to 24 elements in the chlorine (17) to uranium (92) range. Our products are widely celebrated for brilliant precision and long term stability. With time saving quality, functional efficiency and effective usage, the range is widely recommended by clients.


Analysis of

  • Jewellery, precious metals as well as dental alloys Yellow and white gold
  • Gold Manufacturing
  • Assaying and Refinery of Gold
  • Platinum and silver
  • Alloys and coatings
  • Rhodium
  • Multi layer coatings


Fixed Sample Support

For fast and easy sample positioning, the X-ray source as well as semiconductor detector assembly is positioned in the instruments lower chamber. The measuring direction is from underneath the sample supported by a transparent window. The integrated video-microscope with zoom as well as crosshairs simplifies sample placement and allows exact measuring spot adjustment.

General Specification

Intended use

Energy dispersive X-ray measuring instrument (EDXRF) to analyze Gold, precious metals and their alloys in composition and coating thickness. Element range
Chlorine (17) to Uranium (92) up to 24 elements simultaneously Repeatability
0.05% for gold
Measurement time
60 sec
Bench top unit with upwards opening hood
Measuring direction
Bottom up

X-Ray Source

X-ray tube
Micro-focus tungsten tube with beryllium window
Aperture (Collimator)
1 mm (39 mils), optional 2 mm (79 mils) or 0.6 mm (23.6 mils) Measurement spot
Aperture diameter plus 200 m (8 mils), at measurement distance MD = 0 mm

X-Ray Detection

X-ray detector

Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-KAplha) < 160 eV

Measuring distance

0 - 25 mm (0 - 1 in)

Distance compensation with patented DCM method for simplified measurements at different distances. For particular applications or for higher demands on precision an additional calibration might be essential


External dimensions

Width x depth x height 403 x 588 x 365 mm (16 x 23.2 x 14.4 in)


Approx. 45 kg (99 lb)

Product details

Power Supply

AC 115



Analysis Elements

Gold, Silver, Copper, Zinc, Nickel, Cadmium, Lead, Iridium, Ruthenium, Osmium etc.

Power Type




Protection Class