Highly flexible, our array of Electroplating Thickness instrument measures from Top to Bottom. The range with fully enclosed measurement chamber for large apertures and to count high rates that can be processed using silicon drift detector. Excitation as well as radiation detection corresponds to the XDV-SDD that makes it ideal for the study of gold alloys as well as trace analysis of harmful substances in plastics.
The instrument of Electroplating Thickness ensures quick and exact materials analysis with user-friendly features. The array is ideal for the analysis of varied precious metal as well as gold alloys. The collection comes with geometric arrangement of hardware components. X-ray source as well as detector is situated below the measurement chamber and the measurement is conducted from bottom to top for easy & swift positioning of the samples. The range comes in varied versions only differ in terms of detectors, number of apertures, X-ray tubes, and filters.
Features
Applications
Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. |
Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. Mumbai: 9724312808 / 9324639406 Ahmedabad: 9724312808 / 9099086111 |