Electroplating and Electroless Coatings XDV-U

Electroplating and Electroless Coatings

Coating thickness gauge for electroplating and electroless coatings XDV-Âµ or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.

Applications

Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames
Analysis of very thin coatings, e.g., gold/palladium coatings of â¤ 0.1 Î¼m (0.004 mils)
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g., in quality control

General Specification

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures.

Element range:Aluminum Al (13) to Uranium U (92) â up to 24 elements simultaneously.

Design:Bench-top unit with hood opening upwards and housing with a slot on the side.

X/Y- and Z-axis electrically driven and programmable

Motor-driven changeable filters

Measuring direction:Top down

X-Ray Source/Detection

X-ray tube:Standard: Micro focus tube with tungsten target and beryllium window

Optional: Micro focus tube with molybdenum target and beryllium window

High voltage:Three steps: 10 kV, 30 kV, 50 kV

Primary filter:4x changeable: Ni 10 Î¼m (0.4 mils); free; Al 1000 Î¼m (40 mils); Al 500 Î¼m (20 mils)

X-ray optics:Polycapillary

X-Ray Source/Detection
	Standard Non halo-free	Option 20 Î¼m Halo-free	Option 10 Î¼m Non halo-free
Measurement spot, fwhm at Mo-KÎ±	appr. Ã 20 Î¼m (0.8 mils)	appr. Ã 20 Î¼m (0.8 mils)	appr. Ã 10 Î¼m (0.4 mils)
X-ray detector	Peltier-cooled silicon-drift-detector (SDD)	Peltier-cooled silicon-drift-detector (SDD)	Peltier-cooled silicon-drift-detector (SDD)
Effective detector area	20 mm2 (0.03 in2)	50 mm2 (0.08 in2)	50 mm2 (0.08 in2)

For halo-free capillaries, the radiation intensity for all energies of the x-radiation is concentrated on the nominal measurement spot. For capillaries,indicated as non halofree,radiation intensity with high energies (E > 20 keV) can cover a significantly larger area than the nominal measurement spot.

Sample Alignment

Video Microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis, manual focusing and auto-focus, Crosshairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination, Laser pointer (class 1) to support

accurate specimen placement.

Zoom factor:Up to 1080x (Optical: 30x, 90x, 270x; Digital: 1x, 2x, 3x, 4x)

X-Ray Detection

X-ray detector:Proportional counter tube

Absorber:XULM 240 only: optional cobalt or nickel absorber

Measuring distance:0 â¦ 25 mm (0 â¦ 1 in)

Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Evaluation Unit

Computer:WindowsÂ®-PC

Software:Standard: Fischer WinFTMÂ® LIGHT

Optional: Fischer WinFTMÂ® BASIC, PDMÂ®, SUPER

Sample support stage

Sample Stage
	Standard	Option Supporting Plate PCB
Design	Fast, programmable XY-stage with pop-out function	Fast, programmable XY-stage with pop-out function and large placement area for measurements on PCBs
Usable sample placement area	Width x depth: 370 mm x 320 mm (14.6 in x 12.6 in)	Width x depth: 620 mm x 530 mm (24.4 in x 20.9 in)
Usable maximum travel	X/Y-axis: 250 mm x 220 mm (9.8 in x 8.7 in) Z-axis: 140 mm (5.5 in)	X/Y-axis: 250 mm x 220 mm (9.8 in x 8.7 in) Z-axis: 140 mm (5.5 in)
Max. travel speed X/Y	60 mm/s (0.2 ft/s)	60 mm/s (0.2 ft/s)
Repeatability precision X/Y	unidirectional: â¤ 5 Î¼m (0.2 mils) max., â¤ 2 Î¼m (0.08 mils) typ.	unidirectional: â¤ 5 Î¼m (0.2 mils) max., â¤ 2 Î¼m (0.08 mils) typ.
Max. sample weight	5 kg (11 lb), with reduced precision max. 20 kg (44 lb)	5 kg (11 lb), with reduced precision max. 20 kg (44 lb)
Max. sample height	135 mm (5.3 in)	135 mm (5.3 in)