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- XDLM 231: Plane support stage, motor-driven Z-axis
- XDLM 232: Manually operable XY-stage, motor-driven Z-axis
- XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
Applications
- Measurement of electroplated mass-produced parts
- Inspection of thin coatings, e.g., decorative chromium-plating
- Analysis of functional coatings in the electronics and semiconductor industries
- Automated measurements, e.g., on printed circuit boards
General Specification
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys.
Element range:Chlorine (17) to Uranium (92) up to 24 elements simultaneously with option WinFTM BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Top down
X-Ray Source
X-ray tube:Micro-focus tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):4x changeable
Standard (523-440):[mm]: 0.1, 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]: 3.9, 7.9, 2 x 2, 7.9 x 1.2
Optional (523-366):[mm]: 0.1, 0.2, 0.3, 0.3 x 0.05; [mils]: 3.9, 7.9, 11.8, 11.8 x 2
Optional (524-061):[mm]: 0.1, 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: 3.9, 7.9, 11.8 x 2, 2 x 2
Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot: Depending on the measuring distance and on the aperture, the actual measurement. Spot size is shown in the video image.
Smallest measurement spot: approx.
0.1 mm (3.9 mils) with aperture
0.05 x 0.05 mm (2 x 2 mils)
X-Ray Detection
X-ray detector:Proportional counter tube
Measuring distance: 0-80 mm (0-3.2 in)
Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.
Sample Alignment
Sample positioning:Manually
Video microscope:High-resolution CCD colour camera for optical monitoring of the measurement location along the primary beam axis, manual focusing and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator, adjustable LED illumination,laser pointer (class 1) to support accurate sample placement.
Zoom factor:Digital 1x, 2x, 3x, 4x
Evaluation Unit
Computer:Windows-PC
Software:Standard: Fischer WinFTM LIGHT
Optional: Fischer WinFTM BASIC, PDM, SUPER
Sample support stage
| Sample Stage | |||
|---|---|---|---|
|
| XDLM 231 | XDLM 232 | XDLM 237 |
| Design | Fixed sample Support | Manual XY-stage | Programmable XY-stage |
| Maximum travel XY | - | 95 x 150 mm (3.7 x 5.9 in) | 255 x 235 mm (10 x 9.2 in) |
| Travel speed XY | - | - | 80 mm/s (3.1 in/s) |
| Repeatability precision XY | - | - | 0,01 mm (0.4 mils)(*1) |
| Usable sample placement area | 463 x 500 mm (18.2 x 19.7 in) | 420 x 450 mm (16.5 x 17.7 in) | 300 x 350 mm (11.8 x 13.8 in) |
| Z axis | Electrically adjustable | Electrically adjustable | Programmable |
| Travel Z axis | 140 mm (5.5 in) | 140 mm (5.5 in) | 140 mm (5.5 in) |
| Max. sample weight | 20 kg (44 lb) | 20 kg (44 lb) | 5 kg (11 lb) / 20 kg (44 lb)(*2) |
| Max. sample height | 140 mm (5.5 in) | 140 mm (5.5 in) | 140 mm (5.5 in) |
Electrical Data
Power supply:AC 115 V or AC 230 V 50 / 60 Hz
Power consumption:max. 120 W, without evaluation PC
Protection class:IP40
Dimensions
External dimensions:Width x depth x height [mm]: 570 x 760 x 650, [in]: 22 x 30 x 26
Interior dimensions: Width x depth x height [mm]: 460 x 495 x 146, [in]: 18 x 19.5 x 5.7
measurement chamber:
Weight:XDLM 231: 100 kg/220 lbs; XDLM 232: 108 kg/238 lbs;
XDLM 237: 120 kg/265 lbs
Environmental Conditions
Operating temperature:10 C 40 C / 50 F 104 F
Storage/Transport0 C 50 C / 32 F 122 F
temperature:
Admissible air humidity: 95 %, non-condensing
Standards
CE approval:EN 61010
X-Ray standards:DIN ISO 3497 and ASTM B 568
Approval:Fully protected instrument with type approval according to theGerman regulations
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