FISCHERSCOPE X-RAY XDV-
X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for Measurements on Very Small Components and Structures
Applications | Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames |
Features | The FISCHERSCOPE X-RAY XDV- is a universally applicable energy-dispersive x-ray measuring instrument. It is particularly well suited for non-destructive analyses and measurements of coating thicknesses on very small components and structures, even with complex coating systems. |
Design | The FISCHERSCOPE X-RAY XDV- is designed as a user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Zaxis. The housing features a slot in the side allowing for the measurement of even large components, e.g., pc-boards. The sample stage moves into the loading position automatically, when the protective hood is opened. A laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. A high-resolution color video camera simplifies the precise determination of the measurement spot. |
Specification | Intended use Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures |
X-Ray Source | X-ray tube Standard: Micro focus tube with tungsten target and beryllium window Optional: Micro focus tube with molybdenum target and beryllium window. |
X-Ray Detection | X-ray detector Peltier-cooled silicon-drift-detector (SDD) |
Dimensions | External dimensions Width x depth x height [mm] 660 x 835 x 720 mm (26 x 33 x 28.3 in) |
Price:
Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. |
Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. Mumbai: 9724312808 / 9324639406 Ahmedabad: 9724312808 / 9099086111 |