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Wires Coating Thickness Measurement

Wires Coating Thickness Measurement

Product Details:

  • Usage Gold and Silver Testing
  • Machine Weight 45 Kilograms (kg)
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Wires Coating Thickness Measurement Price And Quantity

  • 1 , , Piece

Wires Coating Thickness Measurement Product Specifications

  • 45 Kilograms (kg)
  • Gold and Silver Testing

Wires Coating Thickness Measurement Trade Information

  • 1 , , Piece Per Day
  • 3-4 Week

Product Description

FISCHERSCOPE X-RAY XDV-

X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for Measurements on Very Small Components and Structures

Applications

Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames
Analysis of very thin coatings, e.g., gold/palladium coatings of 0.1 m (0.004 mils)
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g., in quality control

Features

The FISCHERSCOPE X-RAY XDV- is a universally applicable energy-dispersive x-ray measuring instrument. It is particularly well suited for non-destructive analyses and measurements of coating thicknesses on very small components and structures, even with complex coating systems.

Design

The FISCHERSCOPE X-RAY XDV- is designed as a user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Zaxis. The housing features a slot in the side allowing for the measurement of even large components, e.g., pc-boards. The sample stage moves into the loading position automatically, when the protective hood is opened. A laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. A high-resolution color video camera simplifies the precise determination of the measurement spot.

Specification

Intended use Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures
Element range Aluminium Al (13) to Uranium U (92) up to 24 elements simultaneously
Measuring direction Top down

X-Ray Source

X-ray tube Standard: Micro focus tube with tungsten target and beryllium window Optional: Micro focus tube with molybdenum target and beryllium window.
Primary filter 4x changeable: Ni 10 m (0.4 mils); free; Al 1000 m (40 mils); Al 500 m (20 mils)

X-Ray Detection

X-ray detector Peltier-cooled silicon-drift-detector (SDD)



Dimensions

External dimensions Width x depth x height [mm] 660 x 835 x 720 mm (26 x 33 x 28.3 in)
Weight Approx. 135 kg (297 lb)
Interior dimensions of chamber Width x depth x height 580 x 560 x 145 mm (22.8 x 22 x 5.7 in )



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Contact Details

Fischer Measurement Technologies (India) Pvt. Ltd.
City Centre, Office Nos. 3,4 & 5, First Floor,
Plot No. 138/1, Behind Persistent,
Rajiv Gandhi Infotech Park, Phase 1,
Hinjewadi, Pune - 411057. Maharashtra
Phone: +91 20 67909500, Fax: +91 20 67909501

Fischer Measurement Technologies (India) Pvt. Ltd.
2nd Floor, "HARMONY" No. 427/14-1,
9th Main, 5th Block, Jayanagar,
Bangalore - 560011, Karanataka
Mobile: 9880598855 / 9880530494

Fischer Measurement Technologies (India) Pvt. Ltd.
Office # 403, 4th Floor, Block A,
PS IXL - Phase - 1, Chinar Park, New Town,
Kolkata - 700036, West Bengal
Mobile: 9903595331 / 9975752525

Fischer Measurement Technologies (India) Pvt. Ltd.
DSM No. 244, 2nd Floor, DLF Towers-Shivaji Marg,
15, Shivaji Marg, Moti Nagar, New Delhi-110015, INDIA
Mobile: 9650917222 / 9871938867 / 9650040104

Fischer Measurement Technologies (India) Pvt. Ltd.
"Prashanth Real Gold Tower"
Office No.3, 6th Floor, 39, North Usman Road,
T Nagar, Chennai - 600017, Tamil Nadu
Landmark- Above Joy Alukkas Jewellery Showroom
Mobile: 9003937766 / 9880598855

Mumbai: 9724312808 / 9324639406

Ahmedabad: 9724312808 / 9099086111


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