Coating Thickness Measurement for Wires

Robust Entry-Level X-RAY Fluorescence Measuring Instruments for Non-Destructive Material Analysis and Coating Thickness Measurement.

The FISCHERSCOPE X-RAY XULM are high performance, compact and universally applicable x-ray measuring instruments. They are well suited for the non-destructive coating thickness measurement and material analysis. The instruments are well suited for measurements in quality assurance, incoming inspection and process control.

Typical fields of application:

• Measurements on small parts like screws, bolts and nuts
• Measurements on contacts and electronic components
• Determining of the composition of electroplating baths

Additional fields of application of the XULM

• Measurements on very small parts, plug contacts and wires
• Manual measurements on printed circuit boards
• Measurements in the jewellery and watch industries

A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of re-calibration is dramatically reduced, saving time and effort. The fundamental parameter method by FISCHER allows for the analysis of solid and liquid specimens as well as coating systems without calibration.

The XULM  is equipped with a micro-focus x-ray source and electrically changeable apertures and primary filters. Thus, the instrument is also suitable for measurements on small parts.

Design

The FISCHERSCOPE X-RAY XUL/XULM instruments are designed as user-friendly bench-top instruments. According to the intended use, different versions are available with different support stages:

 XUL 210: Fixed sample support

XUL 220 and XULM 240: Manually operable XY stage for accurate positioning of small parts

For quick and easy sample positioning, the X-ray source and detector assembly is located in the instruments lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window.

Despite of their compact size, the instruments are equipped with a large measurement chamber. This allows for measurements on larger specimens. The entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC, using the powerful and user-friendly


General Specification

• Intended use :Energy dispersive x-ray fluorescence measuring instrument (EDXRF) for material analysis and coating thickness measurement
• Element range : Chlorine (17) to Uranium (92)  up to 24 elements simultaneously with option WinFTM
• BASIC Design : Bench top unit with upwards opening hood
• Measuring direction : Bottom up

Specification

Usage/Application	Industrial
Analysis Elements	GUsed,Silver,Copper
Operation Mode	Automatic
Automation Grade	Automatic
Power Type	Electric
Accuracy	0.01
Dimension	403 x 588 x 365 mm
Brand	Fischer
Power Supply	AC 230 V 50 / 60 Hz