PCB Coating Measurement Instrument: XDV-u PCB

Product Description

Typical fields of application:  

To create ideal excitation conditions for every measurement, the instrument features electrically changeable primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity. Due to the innovative Polycapillary x-ray optics, the instrument measures using an extremely small measurement spot yet with a very high excitation intensity.

Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.

The fundamental parameter method by FISCHER allows for the analysis of solid specimens and coating systems without calibration.

Design

The FISCHERSCOPE X-RAY XDV- PCB is designed as a user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Z-axis.

A laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. A high-resolution color video camera simplifies the precise determination of the measurement spot. The optics is equipped with an autofocus function. In order to focus difficult surfaces, the instrument can project a contrast grid onto the specimen surface.