Fischerscope XDV-

Product Description

Fischerscope XDV-M is a highly sensitive energy-dispersive x-ray measuring instrument which is highly suitable for non-destructive analyses and to determine the thickness of coating on very small and large sized components and structures. It is ideal for complex and intricate coating systems which helps to get finer details. Fischerscope XDV-M is suitable for measuring very thin coatings with approx. 0.1 micrometre of thickness. It is equipped with a silicon drift detector which helps to achieves high accuracy and good detection sensitivity. 

Fischerscope X-Ray Xdv-

X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for Measurements on Very Small Components and Structures

Features

The FISCHERSCOPE X-RAY XDV- is a universally applicable energy-dispersive x-ray measuring instrument. It is particularly well suited for non-destructive analyses and measurements of coating thicknesses on very small components and structures, even with complex coating systems.

Design

The FISCHERSCOPE X-RAY XDV- is designed as a user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Zaxis. The housing features a slot in the side allowing for the measurement of even large components, e.g., pc-boards. The sample stage moves into the loading position automatically, when the protective hood is opened. A laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. A high-resolution color video camera simplifies the precise determination of the measurement spot.

Specification

Intended use

Element range

Measuring direction

X-Ray Source

X-ray tube

Primary filter

X-ray detector

Dimension