GOLDSCOPE SD 515

उत्पाद वर्णन

GOLDSCOPE SD 515

• An ergonomically engineered user-friendly device in a compact size with longer service life
• It is light in weight and requires less space for installation.
• The door of the measurement chamber does not open upwards, but towards the front which allows placing notebook for operation onto the instrument thus saves even more space.
• The X-ray source and detector assembly is located in the instrument's lower chamber for quick and easy sample positioning. It is also fitted with the integrated video-microscope with zoom and cross-hairs that simplifies sample placement and also allows a precise measuring spot adjustment.
• The system runs on powerful and user-friendly WinFTMƒ‚‚ software which ensure smooth operations and evaluation of measurements as well as the clear presentation of measurement data.

Features:

• Compact design, efficient, lightweight instrument (appr. 25 kg, 55 lb) and small footprint
• Designed particularly for analysis of gold alloy at reasonable prices
• Equipped with a SI-PIN detector that is also suitable for more complex analyses with other elements
• The machine has been designed for quick and sampling position

Typical fields of applications:

• Jewellery, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
• Multi-layer coatings

General Specification

• Intended use: Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals and their alloys in composition and coating thickness.
• Element range: Chlorine (17) to Uranium (92) ƒ‚¬ up to 24 elements simultaneously
• Repeatability:ƒ€°‚¤ 1 ƒ‚¬‚° for gold, measurement time 60 sec
• Design:Bench top unit with towards the front opening hood
• Measuring direction: Bottom-up

X-Ray Source

• X-ray tube:Tungsten tube, thermally stabilized
• High voltage:Three steps: 30 kV, 40 kV, 50 kV
• Aperture (Collimator): 1 mm (39 mils)
• Measurement spot:Aperture diameter plus 200m (8 mils),at measurement distance MD= 0mm

X-Ray Detection

• X-ray detector:Silicon PIN detector with peltier cooling
• Resolution (fwhm for Mn-‚±):180 V
• Measuring distance:0 ƒ‚¬‚¦ 25 mm (0 ƒ‚¬‚¦ 1 in) Distance compensation with patented DCM method for simplified
  measurements at varying distances. For particular applications or for
  higher demands on accuracy an additional calibration might be necessary.

Sample Alignment

• Sample positioning: Manually
• Video microscope:High-resolution CCD color camera for optical monitoring of the measurement
  the location along the primary beam axis,Cross hairs with a calibrated scale (ruler)
  and spot-indicator, Adjustable LED illumination
• Zoom factor: Digital 1x, 2x, 3x, 4x

Sample Stage

• Design: Fixed sample support
• Usable sample placement area 320 x 350 mm (12.6 x 13.8 in)
• Max. sample weight:13 kg (29 lb)
• Max. sample height:115 mm (4.5 in)  

• Power supply: AC 115 V or AC 230 V 50 / 60 Hz
• Power consumption: max. 120 W, without evaluation PC
• Protection class:IP40

•  External dimensions: Width x depth x height [mm]: 404 x 455 x 367 mm, [in]: 16 x 18 x 14.5
• Weight:Approx. 25 kg (55 lb)

• Operating temperature:10 °C -40 °C / 50 °F- 104°F
• Storage/Transport Temperature: 0 -50 °C / 32 °F - 122 °F
• Admissible air humidity: 95 %, non-condensing

• Computer:Window‚-PC
• Software:Standard: Fischer WinFTM‚ BASIC including PDM
• Optional: Fischer WinFTM SUPER

• CE approval: EN 61010
• X-Ray standards: DIN ISO 3497 and ASTM B 568
• Approval: Individual acceptance inspection as a fully protected instrument
• according to the German regulations "Deutsche Rontgenverordnung-RoV".

Product details