FISCHERSCOPE X-RAY XAN 220
X-Ray Fluorescence Measuring Instruments for fast and non-destructive Analysis and Coating Thickness Measurement of Gold, Gold Watches, Fashion Jewellery and Silver Alloys.
Application | Analysis of Jewellery, precious metals and dental alloys Yellow and white gold |
Design | Fixed Sample Support For quick and easy sample positioning, the X-ray source and semiconductor detector assembly is located in the instruments lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window. The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment. |
General Specification | Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze Gold, precious metals and their alloys in composition and coating thickness. Measurement time 60 sec Design Bench top unit with upwards opening hood Measuring direction Bottom up |
X-Ray Source | X-ray tube Micro-focus tungsten tube with beryllium window Aperture (Collimator) 1 mm (39 mils), optional 2 mm (79 mils) or 0.6 mm (23.6 mils) |
X-Ray Detection | X-ray detector Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K) 160 eV Measuring distance 0 25 mm (0 1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary |
Dimensions | External dimensions Width x depth x height 403 x 588 x 365 mm (16 x 23.2 x 14.4 in) |
Price:
Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. |
Fischer Measurement Technologies (India) Pvt. Ltd. Fischer Measurement Technologies (India) Pvt. Ltd. Mumbai: 9724312808 / 9324639406 Ahmedabad: 9724312808 / 9099086111 |