XRF Spectrometer for PCB

उत्पाद वर्णन

PCB Coating Thickness Measurement Gauge

Coating thickness measurement for PCB using XDLM PCB 210 is a qualitative range of devices available in various technical specifications. These are extensively acknowledged as specific X-ray fluorescence measuring instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards. These are acclaimed for its longer service life and outstanding accuracy. 

Applications

 General Specification

• Intended use: Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys.
• Element range: Chlorine (17) to Uranium U (92)  up to 24 elements simultaneously.
• Design: Bench-top unit with housing with a slot on the side
• Measuring direction: Top down

 X-Ray Source

X-ray tube:

• High voltage: Three steps: 30 kV, 40 kV, 50 kV
• Aperture (Collimator):XDLM-PCB 200/210: 0.1 mm (3.9 mils), optional  0.2 mm (7.9 mils), slot 0.3 x 0.05 mm (11.8 x 2 mils)
• Standard (523-440):  0.1 mm (3.9 mils);  0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils); 0.2 x 0.03 mm (7.9 x 1.2 mils)
• Optional (523-366):  0.1 mm (3.9 mils);0.2 mm (7.9 mils); 0.3 mm (11.8 mils); 0.3 x 0.05 mm (11.8 x 2 mils)
• Measurement spot: Depending on the measuring distance and on the aperture, the actual measurement. Spot size is shown in the video image.
• Smallest measurement spot: Approx. 0.2 mm (7.9 mils)
• Measurement distance: 0-10 mm (0-0.4 in) Distance compensation with patented DCM for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

 X-Ray Detection

• X-ray detector:Proportional counter tube

• Sample positioning:Manually
• Video microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis, Manual focusing and auto-focus, Crosshairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination,Laser pointer (class 1) to support accurate,specimen placement.
• Zoom factor:Digital 1x, 2x, 3x, 4x

 Evaluation Unit

• Computer:Windows-PC
• Software:Standard: Fischer WinFTM LIGHT
• Optional: Fischer WinFTM BASIC, PDM®, SUPER

 Dimensions

 Sample support stage

 Electrical Data

• Power supply:AC 115 V or AC 230 V 50 / 60 Hz
• Power consumption:max. 120 W
• Protection class:IP40

 Environmental Conditions

• Operating temperature:10 - 40°C / 50- 104 °F
• Storage/Transport0- 50 °C / 32 °F  122 °F temperature:
• Admissible air humidity:95 %, non-condensing

 Standards

• CE approval:EN 61010
• X-Ray standards:DIN ISO 3497 and ASTM B 568
• Approval:Fully protected instrument with type approval according to the German regulations.

Product details